Bibliography selection

• Miron Abramovici, Melvin Breuer, Arthur Friedman: “Digital Systems Testing and Testable Design”, Wiley-IEEE Press, 1994
• M.L. Bushnell, V.D. Agrawal: “Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits”, Kluwer Academic Publishers, 2000
• Laung-Terng Wang, Charles Stroud and Nur Touba: “System-on-Chip Test Architectures: Nanometer Design for Testability”, Morgan Kaufmann, 2007 
• Kenneth P. Parker: “The Boundary-Scan Handbook”, Springer, 2015
• Parag K. Lala: “Digital Circuit Testing and Testability”, Academic Press, 1997

Last edited: Monday, 15 February, 2021